潘建根Jiangen Pan

Jiangen Pan.jpg


潘建根教授为杭州远方光电信息股份有限公司董事长兼首席科学家,现任国际照明委员会(CIE)光辐射测量分部(第二分部)中国代表、全国光电测量标准化技术委员会(SAC/TC487)副主任委员、中国照明学会副理事长、浙江省光学学会副理事长。潘建根教授一直从事光电测量技术的研究和设备系统设计工作,曾任教于浙江大学光电系并担任《光度学色度学》主讲教师,已主持了10余项国家863计划课题、国家支撑计划课题以及省重大科技攻关项目。带领团队设计的光电测量设备产品远销世界80余个国家,取得良好经济效益和社会效益。潘建根教授已设计8项美国授权发明专利, 50余项中国授权发明专利;担任CIE TC2-74主席并主持编写CIE239:2020 Goniospectroradiometry of Optical Radiation Sources(光辐射源的空间光谱辐射度学),参与制定CIE S025:2015、CIE S023:2013、CIE 231:2019、CIE233:2019等国际标准,并主持和参与制定了数十项国家标准。潘建根教授主导设计的显示色彩分析仪、光谱亮度计、成像亮度计和DMS显示光电性能分析测量系统等显示测量设备已经大量应用于主流显示器研发与制造公司。

Personal profile

Prof. Jiangen Pan is the Chairman and Chief Scientist of EVERFINE Corporation. He currently serves as the China Country Member in CIE D2, the Division of Physical Measurement of Light and Radiation(Division 2), the Deputy Chairman of the National Technical Committee 487 on Opto-electronic Measurement of Standardization Administration of China(SAC/TC487)Vice President of China Illumination Engineering Society and the Vice Chairman of Optical Society of Zhejiang Province. Prof. Pan has devoted himself to the research of photoelectric measurement technology and the design of measurement systems. He served as the primary lecturer of the course "Photometry and Colorimetry" in the College of Optical Science and Engineering of Zhejiang University and. He has led more than 10 national 863 projects, national support projects and major provincial scientific and technological projects. Furthermore, the photoelectric measurement equipment designed by his team has been exported to more than 80 countries in the world. Prof. Pan has owned 8 US authorized invention patentsand more than 50 China authorized invention patents, he was the TC Chairman of CIETC2-74 which wrote the publication of CIE 239:2020 Goniospectroradiometry of Optical Radiation Sources, he also participated in the preparation ofinternational standards CIE S025:2015, CIE S023:2013, CIE 231:2019,CIE233:2019, and presided over or participated in the publication of tens ofnational standards. In addition, the display measurement instruments designed by Prof. Pan, such as display color analyzers, spectroradiometers, imaging luminance meter/colorimeters and DMS series optical property test systems for FPDs have been widely applied in display R&D and manufacturing in mainstream companies.


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先进显示测量技术与最新进展

潘建根教授

讲座从显示光度色度学基本理论和测量仪器基本原理出发,梳理显示关键光电参数的测量需求和测量方法,并结合AR/VROLEDMini-LEDMicro-LED等新型光电显示的实测结果分析其基础光度色度参数、时间特性、环境光对比度等性能,介绍国内外最新动态,以及应用实例分析,深入浅出,主要面向从事显示器相关研发和品质管理工程技术人员。


Advanced Display Measurement Technology And The Latest Development

Jiangen Pan

Starting from the principles of display photometry and colorimetry and the fundamentals of measuring instruments, the lecture sorts out the display measurement requirements and measurement methods of key photoelectric parameters, and analyzes their basic optical parameters,instantaneous characteristics, ambient contrast ratio and other performancebased on the actual measurement solutions for novel displays such as AR/VRs,OLEDs, Mini-LEDs and Micro-LEDs. The lecture will be easily understood for technicians,engineers, and researchers of display R&D and quality control.