Mou Xi（牟希）

Mou received her Ph.D. from Rensselaer Polytech Institute in the United States. Mou received her B.S. degree in Imaging Science from Rochester Institute of Technology, and M.S. degree in lighting from RPI. With her background in imaging science and lighting, her research interests include human factors and optical measurements in the lighting and display fields. Mou is the China expert of IEC TC 76 Optical Radiation Safety, IEC TC 110 Electronic displays, and liaison officer of TC 110 Electronic displays to ISO/TC94/SC6 Eye and Face Protection, as well as the convenor of CIE RF4 on lighting in the usage of augmented, virtual, and mixed reality devices. She is currently taking the lead in two IEC international standards (IEC62977-2-2:2020 Measurements of optical characteristics - Ambient performance, and IEC 63145-22-20 Specific measurement methods for AR-type – Image qualities.) Mou has been actively involved in developing measurement methods for new-era display technologies.